Multilayer analysis - learn more about the structure of your materials!
The term multilayer analysis is closely related to terms such as material analysis, surface analysis and interface analysis. Multilayer analysis is about examining the chemical composition and the build-up of layer systems and their interfaces to the surrounding material. Most of the layers considered in the multilayer analysis are inorganic multilayer systems (e.g. laser mirrors, bond pads or corrosion protection layers). Nowadays, it is also possible to examine organic layer sequences such as organic light-emitting diodes (OLED) or solar cells (OPV) with the use of modern analysis instruments.
Application areas of multilayer analysis
There are large variations between multilayer systems. They do not merely vary considerably in the type of materials that they consist of. There may also be large differences in the thickness of the examined layers. Examples of layer systems that are regularly examined in our laboratory range from ultra-thin metallic ALD layers or organic SAM films with a thickness of a few nanometers (nm) to corrosion protection layers or hard, wear resistant layers with a comparatively large thickness of a few 10 µm. The large variation in the employed material and the designed layer thickness naturally results in a large number of very different, typical questions for multilayer analysis, as the following list shows:
- Chemical composition or purity of a layer (qualitative or quantitative)
- Determination of the average thickness of a layer
- Roughness of layers
Mixing of layer components by diffusion of other processes
- Determination of layer sequences (e.g. on thermal protection layers or laminates)
- Enrichment of possible impurities in layers or layer interfaces (trace analysis)
- Nucleation, growth and closure of layers (e.g. ALD layers)
- Error analysis: Analysis of unknown layer defects that can be recognized by changed macroscopic properties (e.g. mechanical stability, flaking, adhesion failure, tack, solderability, optical properties).
A large number of analytical techniques (SEM-EDX, ToF-SIMS, XPS (ESCA), LEIS, interferometry, optical microscopy, AFM, FIB, ...) are available in our laboratory. They enable us to investigate these issues in multilayer analysis effectively. In addition, we have a laboratory network that enables us to offer you almost all common methods for layer analysis.
Tascon is your partner for layer analysis
In view of the variety of possible analytical approaches, it is obviously necessary for an effective multilayer analysis in our laboratory to have a priori information about the sample, the layer system and the question that needs to be answered. Such a request for multilayer analysis is always free of charge in our laboratory (contact). On the basis of the information obtained in a personal conversation, we first write a quotation for processing the question as part of the multilayer analysis. The tests that are necessary for the multilayer analysis are usually carried out in our laboratory within a few working days after receipt of the sample, so that a finished report is available after approx. 8-10 working days. We can of course be contacted at any time if you have any questions about the measurements carried out as part of the multilayer analysis or the evaluation of data or our interpretation of the results. Give it a try! For further questions we are glad to help you. Just get in touch with Tascon.