Tascon USA at SEMICON. See us at booth #724.
Tascon USA will participate in this year's SEMICON West in San Francisco, CA (July 13 - 15). Based on results from a cooperation with National Semiconductor, Dr. Albert Schnieders will give a presentation on "Full Wafer Defect Analysis with Time-of-Flight Secondary Ion Mass Spectrometry" at the related Advanced Semiconductor Manufacturing conference on Monday. Additionally you are invited to visit the Tascon booth (#724) in order to get in contact with us.