Plastics are among the most often used materials in the world. Varying properties are achieved by the combination of polymeric macromolecules (matrix) and low molecular weight additives. Generally, combinations of several additives are used to specifically tailor certain properties of the plastic (color, stability, durability, surface reactivity, adhesion for coatings, etc.) to meet the needs of the end product.

All components must be detectable with adequate efficiencies when analyzing samples for product development, process control and failure analysis studies. Additional analytical challenges arise because the additives can range in concentrations from around 100ppm to some percent and surface diffusion and segregation processes lead to different compositions in the bulk versus the surface.

For fast and dedicated analyses on polymer related samples, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is the method of choice. Not only can it offer elemental and molecular information at the same time, but with modern instrumentation detection limits are in the lower ppm range. Recent developments in instrument technology allows both 2D and 3D imaging of additives on the sub-micron scale.

Possible Problems

• characterization of polymer additives
• characterization of the repeat unit
• end group characterization
• determination of the molecular weight distribution
• segregation
• surface diffusion
• adhesion behavior
• monitoring of surface modifications
• blooming
• particles
• ...